The Thin Films Laboratory Team Lead Dr.phys. Martiņs Zubkins had the pleasure of visiting the Helsinki Accelerator Laboratory, University of Helsinki, to perform ToF-ERDA (Time-of-Flight Elastic Recoil Detection Analysis) measurements on our photochromic thin films.
This advanced technique enables precise determination of composition and depth profiles in thin films – a key step in understanding and optimizing our photochromic materials.
During the visit, I also had the opportunity to learn more about the ToF-ERDA technique, give a lecture on our ongoing research, and discuss possible future collaborations.
We would like to thank Kostas Sarakinos, Dmitry Moldarev, and all the laboratory staff at the Accelerator Laboratory for their very warm hospitality. It was a truly inspiring and productive visit! 🙌
Martins Zubkins acknowledges the support of the PostDoc Latvia research programme,
project No. 1.1.1.9/LZP/1/24/011.
