ToF-ERDA (Time-of-Flight Elastic Recoil Detection Analysis) measurements on our photochromic thin films.
The Thin Films Laboratory Team Lead Dr.phys. Martiņs Zubkins had the pleasure of visiting the Helsinki Accelerator Laboratory, University of Helsinki, to perform ToF-ERDA (Time-of-Flight Elastic Recoil Detection Analysis) measurements on our photochromic thin films. This advanced technique enables precise… Read More »ToF-ERDA (Time-of-Flight Elastic Recoil Detection Analysis) measurements on our photochromic thin films.








